FARO Technologies

FARO® is the world’s most trusted source for 3D measurement, imaging and realization technology. The company develops and manufactures leading edge solutions that enable high-precision 3D capture, measurement and analysis across a variety of industries including manufacturing, construction, engineering and public safety.

FARO’s global headquarters are located in Lake Mary, Florida. The Company also has a technology center and manufacturing facility consisting of approximately 90,400 square feet located in Exton, Pennsylvania containing research and development, manufacturing and service operations of our FARO Laser Tracker and FARO Cobalt Array 3D Imager product lines.

www.faro.com

Featured Technology

3D Inspections – Reverse Engineering

FARO® is the world’s most trusted source for 3D measurement solutions for 3D Manufacturing applications. FARO’s full portfolio of laser-guided manufacturing hardware and software provides turnkey solutions for manual and automated inspection, plus actionable analysis of any part, component or final assembly.

FARO’s range of portable CMM (coordinate measuring machine) solutions includes Measuring Arms, Laser Trackers, 3D Imagers, Laser Projectors, Mobile Inspection Solutions, and Metrology Software. These solutions are widely deployed to streamline manufacturing and inspection workflows.

For 3D inspections, CAD-to-part analysis, alignments and reverse engineering, FARO’s portable CMMs are the industry standard in 3D Manufacturing.

We create unique value and support operational excellence for our customers by:

  • Enabling faster, more accurate, compelling and usable 3D documentation
  • Accelerating execution timelines
  • Minimizing in field 3D documentation and measurement times
  • Shrinking margin impacting scrap and rework costs
  • Reducing development risk

Alex McPherson
503-780-7589
alex.mcpherson@faro.com

FARO ScanArm

The FARO 8-Axis Quantum ScanArm offers a comprehensive, contact/non-contact metrology solution, which allows users to significantly speed up and simplify their measurement and scanning activities. This is due to the limited device movements required to reach the features of interest and the reduced need for relocation of the measuring device to different positions around the object to be measured.

Jeffrey Huber
443-824-8121
jeffrey.m.huber.civ@mail.mil